Le Journal de Physique IV

Perovskite heterostructures grown by MOCVD p. Pr11-3

O.Yu. Gorbenko, I.E. Graboy, A.R. Kaul, G. Wahl et V.L. Svetchnikov

DOI: https://doi.org/10.1051/jp4:20011101

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New interface effects in ferroelectric thin films p. Pr11-9

J.F. Scott et M. Dawber

DOI: https://doi.org/10.1051/jp4:20011102

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Fine-structural characterisation of magnetic superlattices p. Pr11-23

M. Rosina, C. Dubourdieu, M. Audier, E. Dooryhee, J.L. Hodeau, F. Weiss et K. Fröhlich

DOI: https://doi.org/10.1051/jp4:20011103

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PbZr_0.52Ti_0.48O₃ and SrBi₂Nb₂O₉ ferroelectric oxides integrated with YBa₂Cu₃O₇ superconductor in multilayers epitaxially grown by pulsed laser deposition p. Pr11-29

J.R. Duclère, M. Guilloux-Viry, A. Perrin, C. Soyer, E. Cattan, D. Remiens, A. Dauscher, S. Weber et B. Lenoir

DOI: https://doi.org/10.1051/jp4:20011104

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Mechanical behaviour of a multilayer system for microelectronic applications p. Pr11-35

O. Bernard, S. Poulat, S. Poissonnet, A.-M. Huntz et M. Andrieux

DOI: https://doi.org/10.1051/jp4:20011105

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Epitaxial YBa₂Cu₃O_7-8/SrTiO₃ heterostructures grown by pulsed laser deposition for voltage agile microwave filter applications p. Pr11-41

K. Bouzehouane, P. Woodall, B. Marcilhac, A.N. Khodan, D. Crété, E. Jacquet, J.C. Mage et J.P. Contour

DOI: https://doi.org/10.1051/jp4:20011106

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Epitaxial YBa₂Cu₃O_7-8 films : Crucial role of growth-induced linear defects in microwave properties p. Pr11-47

V.M. Pan, V.S. Flis, V.A. Komashko, O.G. Plys, C.G. Tretiatchenko, E.A. Pashitskii, A.N. Ivanyuta, G.A. Melkov, V.L. Svetchnikov et H.W. Zandbergen

DOI: https://doi.org/10.1051/jp4:20011107

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Investigation of spin-polarized carrier injection effect in|YBa₂Cu₃O₇/SrTiO₃/La_0.67/Sr_0.33MnO₃ and YBa₂Cu₃O₇/La_0.67Sr_0.33MnO₃ heterostructures p. Pr11-53

B. Vengalis, V. Plausinaitiene, A. Abrutis, Z. Saltyte, R. Butkute, V. Petrauskas, J. Maria et G. Bonfait

DOI: https://doi.org/10.1051/jp4:20011108

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Nonlinear dielectric response of c- and a-axis oriented epitaxial (Ba,Sr)TiO₃ layers between metallic oxide electrodes p. Pr11-59

Yu.A. Boikov, Z.G. Ivanov et T. Claeson

DOI: https://doi.org/10.1051/jp4:20011109

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Pulsed laser deposition of PbMg_1/3Nb_2/3O₃ thin films and PbMg_1/3Nb_2/3O₃/PbTiO₃ multilayers p. Pr11-65

N. Lemée, H. Bouyanfif, J.L. Dellis, M. El Marssi, M.G. Karkut, L. Dupont, B. Dkhil et J.M. Kiat

DOI: https://doi.org/10.1051/jp4:20011110

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Dielectric properties of Ti-deficient SrTiO_3-δ thin films p. Pr11-71

D. Fuchs, M. Adam et R. Schneider

DOI: https://doi.org/10.1051/jp4:20011111

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Substrate dependent growth of highly conductive RuO₂ films p. Pr11-77

K. Fröhlich, D. Machajdik, V. Cambel, R. Luptak, S. Pignard, F. Weiss, P. Baumann et J. Lindner

DOI: https://doi.org/10.1051/jp4:20011112

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Vanadium pentoxide thin films deposited by atomic layer deposition: A model electrode for investigating the structural changes induced by lithium intercalation p. Pr11-85

R. Baddour-Hadjean, V. Golabkan, J.P. Pereira-Ramos, A. Mantoux et D. Lincot

DOI: https://doi.org/10.1051/jp4:20011113

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Ultra-fast fault current limiter based on La-Ca-MnO₃ thin films p. Pr11-91

S. Balevicius, O. Kiprijanovic, F. Anisimovas, B. Vengalis, N. Zurauskiene, P. Cimmperman et L.L. Altgilbers

DOI: https://doi.org/10.1051/jp4:20011114

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Anisotropic resistance change of La_0.7Sr_0.3MnO₃ thin films effected by in-plane axial strain p. Pr11-97

C. Simkevicius, V. Stankevic, S. Balevicius, A. Abrutis, V. Plausinaitiene, L. Dapkus, B. Vengalis et N. Zurauskiene

DOI: https://doi.org/10.1051/jp4:20011115

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Chloride atomic-layer chemical vapor deposition of TiO₂ with a chloride pretreatment of substrates p. Pr11-103

A. Niilisk, A. Rosental, T. Uustare, A. Kasikov et A. Tarre

DOI: https://doi.org/10.1051/jp4:20011116

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YBCO coated conductors by reactive thermal co-evaporation p. Pr11-109

U. Schmatz, Ch. Hoffmann, M. Bauer, R. Metzger, P. Berberich et H. Kinder

DOI: https://doi.org/10.1051/jp4:20011117

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Preparation and characterization of Au/ZrO₂ composite obtained by oxidation of thin film Zr_xAu_y alloy p. Pr11-115

N. Sanz, M. Lomello-Tafin et Ph. Galez

DOI: https://doi.org/10.1051/jp4:20011118

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Dynamic electrical response of YBaCuO thin films as a function of microstructure in view of applications to agile electronics p. Pr11-121

F. Abbott, A.F. Dégardin, A. De Luca, O. Schneegans, É. Caristan et A.J. Kreisler

DOI: https://doi.org/10.1051/jp4:20011119

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Growth and characterization of LaMnO₃/SrTiO₃ bi-layer p. Pr11-127

M. Pripko, A. Halabica, K. Fröhlich, A. Plecenik, V. Cambel, S. Chromik et D. Machajdik

DOI: https://doi.org/10.1051/jp4:20011120

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SrBi₂Nb₂O₉ ferroelectric thin films deposited by pulsed laser deposition on textured and epitaxied platinum electrodes p. Pr11-133

J.R. Duclère, M. Guilloux-Viry, A. Perrin, A. Dauscher, S. Weber, B. Lenoir, C. Soyer, E. Cattan et D. Remiens

DOI: https://doi.org/10.1051/jp4:20011121

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Annealing effects on electrical and structural properties of Al₂O₃ films deposited by ALD p. Pr11-139

Y. Chang, F. Ducroquet, L.G. Gosset, A. Sibai, V. Dashtizadeh, J.F. Damlencourt, G. Rollandan et F. Martin

DOI: https://doi.org/10.1051/jp4:20011122

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rf-sputtering of PMNT thin films p. Pr11-145

E. Fribourg-Blanc, E. Cattan, D. Remiens, M. Dupont et D. Osmont

DOI: https://doi.org/10.1051/jp4:20011123

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Superconducting switch for high power pulse antenna excitation p. Pr11-151

A. Jukna

DOI: https://doi.org/10.1051/jp4:20011124

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Preparation of TI-1223 and TI-2223 superconducting films by spray pyrolysis p. Pr11-157

S. Phok, Z.I. Supardi, A. Sin, Ph. Galez, J.L. Jorda et F. Weiss

DOI: https://doi.org/10.1051/jp4:20011125

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Model of electric field-induced charge disordering in praseodymium manganites p. Pr11-163

S. Lapinskas et E.E. Tornau

DOI: https://doi.org/10.1051/jp4:20011126

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SrTiO₃ thin films on Si(110) and Si(100) substrates p. Pr11-169

M. Spankova, S. Chromik, I. Vavra, S. Gazi et P. Kus

DOI: https://doi.org/10.1051/jp4:20011127

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Hg-cuprate thin films prepared using Re and fluorides based precursor thin films p. Pr11-175

S. Chromik, D. De Barros, V. Strbik, P. Odier, A. Sin, F. Hanic et I. Kostic

DOI: https://doi.org/10.1051/jp4:20011128

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Spectral ellipsometry of La_1-xMnO₃ films with different degree of epitaxy p. Pr11-181

G.-J. Babonas, A. Reza, K. Fröhlich, M. Pripko et D. Machajdik

DOI: https://doi.org/10.1051/jp4:20011129

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Structural and optical properties of LiNbO₃ thin films grown by pulsed laser deposition p. Pr11-187

L. Canale, C. Girault-Di Bin, P. Di Bin, C. Darraud-Taupiac et J.L. Decossas

DOI: https://doi.org/10.1051/jp4:20011130

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Pulsed laser deposited barium strontium titanate thin films : Cristallographic and dielectric characterizations p. Pr11-193

S. Liebus, C. Girault-Di Bin, F. Cosset, A. Celerier et J.C. Vareille

DOI: https://doi.org/10.1051/jp4:20011131

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Effect of TaSi₂ and WSi₂ deposition on interfacial defects and Fowler-Nordheim injection in polycide gate SiO₂ MOS capacitors p. Pr11-199

S. Croci, C. Plossu, B. Balland, J.L. Autran et P. Boivin

DOI: https://doi.org/10.1051/jp4:20011132

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Time evolution of La_xMnO₃/normal metal point contact resistance p. Pr11-205

A. Halabica, A. Plecenik, M. Pripko et K. Fröhlich

DOI: https://doi.org/10.1051/jp4:20011133

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Oxygen diffusion in La_2/3Ga_1/3MnO₃ and Sr₂FeMoO₆ thin films p. Pr11-209

B. Vengalis, V. Lisauskas, V. Pyragas, K. Sliuziene, A. Oginskis, A. Cesnys, J. Santiso et A. Figueras

DOI: https://doi.org/10.1051/jp4:20011134

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YBa₂Cu₃O_7-x and La_1-xSr_xMnO₃ thin films grown by pulsed injection MOCVD p. Pr11-215

A. Abrutis, V. Plausinaitiene, A. Teiserskis, Z. Saltyte, V. Kubilius, A. Bartasyte et J.P. Sénateur

DOI: https://doi.org/10.1051/jp4:20011135

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Pulsed injection MOCVD of heteroepitaxial multilayers of perovskite oxides p. Pr11-221

A. Abrutis, V. Plausinaitiene, A. Teiserskis, Z. Saltyte, V. Kubilius, B. Vengalis, L. Dapkus et J.P. Sénateur

DOI: https://doi.org/10.1051/jp4:20011136

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A Raman scattering investigation of tensile strain in La_0.7Sr_0.3Mn0₃/SrTi0₃ multilayers p. Pr11-227

J. Kreisel, G. Lucazeau, C. Dubourdieu, M. Rosina et F. Weiss

DOI: https://doi.org/10.1051/jp4:20011137

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Scale up of a single source MOCVD system for deposition of YBCO onto travelling tapes p. Pr11-233

O. Stadel, J. Schmidt, G. Wahl, F. Weiss, D. Selbmann, J. Eickemeyer, O.Yu. Gorbenko, A.R. Kaul et C. Jimenez

DOI: https://doi.org/10.1051/jp4:20011138

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NiO layers on Ni RABiTS for epitaxial buffer deposition by LS MOCVD p. Pr11-239

D. Selbmann, J. Eickemeyer, H. Wendrock, C. Jimenez, S. Donet, F. Weiss, U. Miller et O. Stadel

DOI: https://doi.org/10.1051/jp4:20011139

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Substrate deformation induced by epitaxial La_0.8MnO_3-δ thin films p. Pr11-247

S. Pignard, M. Audier, H. Vincent et J.P. Sénateur

DOI: https://doi.org/10.1051/jp4:20011140

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Low pressure CVD of transparent Cu-Al-O and Cu-Ti-O thin films p. Pr11-253

D. Barreca, G.A. Battiston, U. Casellato, R. Gerbasi et E. Tondello

DOI: https://doi.org/10.1051/jp4:20011141

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Effects of active surface nitridation on the properties of high permittivity films deposited by UV-assisted CVD p. Pr11-261

B.J. O'Sullivan, E. O'Connor, R. Howley, P.K. Hurley, J.-Y. Zhang, N. Kaliwoh, Q. Fang, I. W. Boyd, C. Dubourdieu, M.A. Audier et al. (5 de plus)

DOI: https://doi.org/10.1051/jp4:20011142

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Modeling the diffraction profiles of CVD-grown perovskite oxide superlattices p. Pr11-267

E. Dooryhee, J.L. Hodeau, M. Nemoz, J.A. Rodriguez, C. Dubourdieu, R. Pantou, M. Rosina, F. Weiss, J.P. Sénateur, M. Audier et al. (2 de plus)

DOI: https://doi.org/10.1051/jp4:20011143

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Transmission electron microscopy and X-ray diffraction study of aluminium oxycarbide α'-Al₂CO p. Pr11-273

P. Dluzewski, J.N. Gorecka, W. Paszkowicz et A. Yamaguchi

DOI: https://doi.org/10.1051/jp4:20011144

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Black body coating by spray pyrolysis p. Pr11-277

B. Rousseau, A. Sin, P. Odier, F. Weiss et P. Echegut

DOI: https://doi.org/10.1051/jp4:20011145

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Characterization of transparent ZnM₂O₄ coatings (M = Al, Ga) obtained by sol-gel routes with heterometallic alkoxides as precursors p. Pr11-283

S. Daniele, D. Tcheboukov et L.G. Hubert Pfalzgraf

DOI: https://doi.org/10.1051/jp4:20011146

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Photoformation of zirconium oxide at low temperatures p. Pr11-289

J.J. Yu, Q. Fang et I.W. Boyd

DOI: https://doi.org/10.1051/jp4:20011147

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Photo-CVD deposited TiO₂ films studied by Raman and XPS spectroscopy p. Pr11-295

J.Y. Zhang, Q. Fang, J.X. Wu, C.Y. Xu, B.J. O'Sullivan, P.K. Hurley, T.L. Leedham, M.A Audier, J.P. Sénateur et I.W. Boyd

DOI: https://doi.org/10.1051/jp4:20011148

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XPS investigation of UV-annealed ultrathin Ta₂O₂ films on silicon p. Pr11-301

Q. Fang, J.Y. Zhang, Z.M. Wang, J.X. Wu, B.J. O'Sullivan, P.K. Hurley, T.L. Leedham, M.A. Audier, J.P. Sénateur et I.W. Boyd

DOI: https://doi.org/10.1051/jp4:20011149

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In situ characterisation of Sr₂FeMoO₆ films prepared by pulsed laser deposition p. Pr11-307

J. Santiso, J. Fraxedas, L.I. Balcells, J. Fontcuberta et A. Figueras

DOI: https://doi.org/10.1051/jp4:20011150

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Electrical properties of (BaTiO₃/SrTiO₃)₁₅ superlattices grown by MOCVD p. Pr11-313

R. Pantou, C. Dubourdieu, F. Weiss, J.P. Sénateur, G. Köbernik et W. Haessler

DOI: https://doi.org/10.1051/jp4:20011151

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YBCO coated nickel-based tapes with various buffer layers p. Pr11-319

S. Donet, F. Weiss, J.P. Sénateur, P. Chaudouet, A. Abrutis, A. Teiserskis, Z. Saltyte, D. Selbmann, J. Eickemeyer, O. Stadel et al. (3 de plus)

DOI: https://doi.org/10.1051/jp4:20011152

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Erbium doped yttria thin films deposited by injection CVD p. Pr11-325

J.L. Deschanvres et W. Meffre

DOI: https://doi.org/10.1051/jp4:20011153

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Electronic devices based on semiconducting strontium titanate p. Pr11-331

D. Marré, E. Bellingeri, I. Pallecchi, L. Pellegrino, A. Tumino et A.S. Siri

DOI: https://doi.org/10.1051/jp4:20011154

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Doping of SrTiO₃ thin films studied by spectroscopic ellipsometry p. Pr11-337

L. Pellegrino, M. Canepa, G. Gonella, E. Bellingeri, D. Marré, A. Tumino et A.S. Siri

DOI: https://doi.org/10.1051/jp4:20011155

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