Numéro |
J. Phys. IV France
Volume 11, Numéro PR11, Décembre 2001
International Conference on Thin Film Deposition of Oxide Multilayers Hybrid Structures
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Page(s) | Pr11-233 - Pr11-237 | |
DOI | https://doi.org/10.1051/jp4:20011138 |
J. Phys. IV France 11 (2001) Pr11-233-Pr11-237
DOI: 10.1051/jp4:20011138
Scale up of a single source MOCVD system for deposition of YBCO onto travelling tapes
O. Stadel1, J. Schmidt1, G. Wahl1, F. Weiss2, D. Selbmann3, J. Eickemeyer3, O.Yu. Gorbenko4, A.R. Kaul4 and C. Jimenez1 Institut für Oberflächentechnik und Plasmatechnische Werkstoffentwicklung (IOPW), Technische Universität Braunschweig, Germany
2 Laboratoire des Matériaux et du Génie Physique (LMPG), ENSPG, Grenoble, France
3 Institut für Festkörper und Werkstofforschung Dresden (IFW), Germany
4 Department of Chemistry
Abstract
MOCVD is a promising economic method for the production of YBCO tapes. An enlarged single source MOCVD-system for continuous deposition of YBCO on metal tapes was developed. Computer simulations with FLUENT code were used for the design of the new tape system, which is based on a former small tape system. The calculated temperature distribution, precursor mole fractions and gas flows lead to a better understanding of the important aspects of the design.
In this new system single crystals, IBAD buffered tapes and buffered textured Ni-tapes were transported through the deposition zone and coated with YBCO. On Single crystals, IBAD buffered substrates and textured Ni the best critical current densities at 77 K of the 300-500 nm thick YBCO films were 4.8 MA/cm2, 2.5 MA/cm2 and 0.25 MA/cm2 respectively. The velocity for the tape transport was 4 m/h for these substrates. The XRD-measurements of the YBCO-film on single crystalline LaAlO3 showed only c-axis orientation with FWHM(OO5) = 0.10° for the rocking curve and with FWHM(102) = 0.7° for the phi scan.
© EDP Sciences 2001