| Numéro |
J. Phys. IV France
Volume 11, Numéro PR11, Décembre 2001
International Conference on Thin Film Deposition of Oxide Multilayers Hybrid Structures
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|---|---|---|
| Page(s) | Pr11-121 - Pr11-125 | |
| DOI | https://doi.org/10.1051/jp4:20011119 | |
International Conference on Thin Film Deposition of Oxide Multilayers Hybrid Structures
J. Phys. IV France 11 (2001) Pr11-121-Pr11-125
DOI: 10.1051/jp4:20011119
LGEP, Supélec, UMR 8507 du CNRS, Universités Paris 6 et Paris 11, 11 rue Joliot-Curie, Plateau du Moulon, 91192 Gif-sur-Yvette cedex, France
© EDP Sciences 2001
J. Phys. IV France 11 (2001) Pr11-121-Pr11-125
DOI: 10.1051/jp4:20011119
Dynamic electrical response of YBaCuO thin films as a function of microstructure in view of applications to agile electronics
F. Abbott, A.F. Dégardin, A. De Luca, O. Schneegans, É. Caristan and A.J. KreislerLGEP, Supélec, UMR 8507 du CNRS, Universités Paris 6 et Paris 11, 11 rue Joliot-Curie, Plateau du Moulon, 91192 Gif-sur-Yvette cedex, France
Abstract
The electrical characteristics of YBaCuO thin films sputtered on LaAlO3 and MgO single-crystal substrates have been measured using a pulsed current technique, to avoid ohmic heating effects. The results are discussed in relation with deposition temperature (for films deposited on LaAlO3) and substrate preparation (for films deposited on MgO). In the latter case, results are also discussed in the framework of a statistical model, which provides an empirical approach for the pinning phenomena in YBaCuO films, when a static magnetic field is applied.
© EDP Sciences 2001