Numéro
J. Phys. IV France
Volume 11, Numéro PR11, Décembre 2001
International Conference on Thin Film Deposition of Oxide Multilayers Hybrid Structures
Page(s) Pr11-127 - Pr11-131
DOI https://doi.org/10.1051/jp4:20011120
International Conference on Thin Film Deposition of Oxide Multilayers Hybrid Structures

J. Phys. IV France 11 (2001) Pr11-127-Pr11-131

DOI: 10.1051/jp4:20011120

Growth and characterization of LaMnO3/SrTiO3 bi-layer

M. Pripko, A. Halabica, K. Fröhlich, A. Plecenik, V. Cambel, S. Chromik and D. Machajdik

Institute of Electrical Engineering, Slovak Academy of Sciences, Dubravska Cesta 9, 84239 Bratislava, Slovakia


Abstract
We report about LaMnO3/SrTiO3 bi-layers deposited by using injection metal-organic chemical vapour deposition (MOCVD). We have studied structure of the bi-layers by X-ray diffraction and its surface by AFM. Properties of the LaMnO3/SrTiO3 interface in fabricated LaMnO3/SrTiO3/Au tunnel junction were investigated by tunneling measurements. Obtained results are discussed with regard to suitability of MOCVD grown SrTiO3 film as a matenal for tunnel junction barrier.



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