Molecular ways to nanoscale particles and films p. 1 H. Shen et S. Mathur DOI: https://doi.org/10.1051/jp4:20020070 RésuméPDF (729.7 KB)
Real time monitoring of the growth of metallic thin films by in situ pyrometry p. 9 C. Gasqueres, F. Maury et F. Ossola DOI: https://doi.org/10.1051/jp4:20020071 RésuméPDF (462.8 KB)
Preliminary studies of atmospheric pressure plasma enhanced CVD (AP-PECVD) of thin oxide films p. 17 N. McSporran, M.L. Hitchman, S.E. Alexandrov, S.H. Shamlian, S. Turnbull et S. Turnbull DOI: https://doi.org/10.1051/jp4:20020072 RésuméPDF (430.2 KB)
Reflectance anisotropy studies of the oxidation of (001) GaAs surfaces in an MOCVD reactor p. 25 M.N. Simcock, L. He et M.E. Pemble DOI: https://doi.org/10.1051/jp4:20020073 RésuméPDF (262.6 KB)
Controlled-growth of platinum nanoparticles on carbon nanotubes or nanospheres by MOCVD in fluidized bed reactor p. 29 P. Serp, R. Feurer, J.L. Faria et J.L. Figueiredo DOI: https://doi.org/10.1051/jp4:20020074 RésuméPDF (1.604 MB)
Atmospheric pressure chemical vapour deposition of BPSG films from TEOS, 03, TMB, TMPI: Determination of a chemical mechanism p. 37 J.-P. Nieto, B. Caussat, J.-P. Couderc, I. Orain' et L. Jeannerot DOI: https://doi.org/10.1051/jp4:20020075 RésuméPDF (454.6 KB)
Design, synthesis, and application of new Ti precursors compatible with Ba and Sr precursors for BST thin film by MOCVD p. 45 K. Woo DOI: https://doi.org/10.1051/jp4:20020076 RésuméPDF (444.5 KB)
Simulation and validation of SiO2 LPCVD from TEOS in a vertical 300 mm multi-wafer reactor p. 51 G.J. Schoof, C.R. Kleijn, H.E.A. Van Den Akker, T.G.M. Oosterlaken, H.J.C.M. Terhorst et F. Huussen DOI: https://doi.org/10.1051/jp4:20020077 RésuméPDF (606.4 KB)
Advances in the use of MOCVD methods for the production of novel photonic bandgap materials p. 63 D.E. Whitehead, M.E. Pemble, H.M. Yates, A. Blanco, C. Lopez, H. Miguez et F.J. Meseguer DOI: https://doi.org/10.1051/jp4:20020078 RésuméPDF (528.0 KB)
Evaluation of corrosion behaviour of tantalum coating obtained by low pressure chemical vapor deposition using electrochemical polarization p. 69 A. Levesque, A. Bouteville, H. de Baynast et B. Laveissière DOI: https://doi.org/10.1051/jp4:20020079 RésuméPDF (687.3 KB)
Molecular beam mass spectrometry analysis of gaseous species responsible for diamond deposition in microwave plasmas p. 75 O. Aubry, J.-L. Delfau, C. Met, M.I. De Barros, L. Vandenbulcke et C. Vovelle DOI: https://doi.org/10.1051/jp4:20020080 RésuméPDF (638.0 KB)
A study by GC-MS of the decomposition of precursors for the MOCVD of high temperature superconductors p. 85 O.V. Lopaeva, M.L. Hitchman, S.H. Shamlian et D.R. Watson DOI: https://doi.org/10.1051/jp4:20020081 RésuméPDF (470.7 KB)
Growth of carbon nanotubes by fluidized bed catalytic chemical vapor deposition p. 93 D. Venegoni, P. Serp, R. Feurer, Y. Kihn, C. Vahlas et P. Kalck DOI: https://doi.org/10.1051/jp4:20020082 RésuméPDF (811.1 KB)
Vapor-phase synthesis and characterization of ZnSe nanoparticles p. 99 D. Sarigiannis, R.P. Pawlowski, J.D. Peck, T.J. Mountziaris, G. Kioseoglou et A. Petrou DOI: https://doi.org/10.1051/jp4:20020083 RésuméPDF (685.3 KB)
Modification of multiwalled carbon nanotubes by different breaking processes p. 107 I. Vesselényi, A. Siska, D. Méhn, K. Niesz, Z. Konya, J.B. Nagy et I. Kiricsi DOI: https://doi.org/10.1051/jp4:20020084 RésuméPDF (498.6 KB)
Unveiling the magic of H2S on the CVD-Al2O3 coating. Effect of H2S on the water gas concentration p. 113 T. Oshika, M. Sato et A. Nishiyama DOI: https://doi.org/10.1051/jp4:20020085 RésuméPDF (502.3 KB)
Multi-model hierarchy approach to simulate barrel reactors for epitaxial silicon deposition p. 121 M. Di Stanislao, G. Valente, S. Fascella, C. Spampinato, M. Masi et S. Carrà DOI: https://doi.org/10.1051/jp4:20020086 RésuméPDF (579.2 KB)
Hydrogen storage in carbon nanotubes produced by CVD p. 129 A. Fonseca, N. Pierard, S. Tollis, G. Bister, Z. Konya, N. Nagaraju et J.B. Nagy DOI: https://doi.org/10.1051/jp4:20020087 RésuméPDF (649.4 KB)
MOCVD of aluminium oxide films using aluminium β-diketonates as precursors p. 139 A. Devi, S.A. Shivashankar et A.G. Samuelson DOI: https://doi.org/10.1051/jp4:20020088 RésuméPDF (728.8 KB)
Conductive Cu-TiO2 thin films obtained via MOCVD p. 147 F. Alvarez y Quintavalle, G.A. Battiston, U. Casellato, D. Fregona, R. Gerbasi et F. Loro DOI: https://doi.org/10.1051/jp4:20020089 RésuméPDF (636.6 KB)
Characterization of amorphous SIC:H thin films grown by RF plasma enhanced CVD on annealing temperature p. 155 M.G. Park, W.S. Choi, J.-H. Boo, Y.T. Kim, D.H. Yoon et B. Hong DOI: https://doi.org/10.1051/jp4:20020090 RésuméPDF (329.4 KB)