Issue |
J. Phys. IV France
Volume 128, September 2005
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Page(s) | 77 - 80 | |
DOI | https://doi.org/10.1051/jp4:2005128012 |
J. Phys. IV France 128 (2005) 77-80
DOI: 10.1051/jp4:2005128012
Ferroelectric (Na1/2Bi1/2)TiO3-BaTiO3 thin films obtained by pulsed laser deposition
M. Dinescu1, F. Craciun2, N. Scarisoreanu1, P. Verardi3, A. Moldovan1, A. Purice1, A. Sanson4 and C. Galassi41 NILPRP Bucharest, PO Box MG-16, 77125, Romania
2 CNR Istituto dei Sistemi Complessi, Via del Fosso del Cavaliere 100, 00133 Rome, Italy
3 CNR-Istituto di Acustica, Via del Fosso del Cavaliere 100, 00133 Rome, Italy
4 CNR-ISTEC, Via Granarolo 64, 48018 Faenza, Italy
Abstract
The solid solution of the ferroelectric relaxor (Na1/2Bi1/2)TiO3 with BaTiO3, (1-x) NBT-x BT (NBT-BT) shows a
morphotropic phase boundary with enhanced properties at x = 0.06-0.07. We
have prepared targets of (1-x) NBT-x BT with x = 0.06 by solid state
reaction and sintering at 1200 C, up to a final relative density of
97.8%. Films from these targets have been deposited on MgO substrates by
pulsed laser deposition, in different substrate temperature and heating rate
conditions. First results obtained from structural, AFM and electrical
characterization are reported. The obtained films are polycrystalline
perovskite with a slight (100) orientation. High relative dielectric
constant, of about 1300, have been obtained.
© EDP Sciences 2005