Issue
J. Phys. IV France
Volume 104, March 2003
Page(s) 267 - 270
DOI https://doi.org/10.1051/jp4:200300077


J. Phys. IV France
104 (2003) 267
DOI: 10.1051/jp4:200300077

Optical configurations for X-ray imaging by projection

L. Alianelli1, 2, M. Sanchez del Rio3, A.Ya. Faenov4, T. Pikuz4, R. Felici1 and O. Hignette3

1  INFM-OGG, c/o ESRF, BP. 220, 38043 Grenoble cedex, France
2  Institut Laue Langevin, BP. 156, 38046 Grenoble cedex, France
3  European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble cedex, France
4  Multicharged lons Spectra Data Center of VNIIFTRI, Mendeleevo, 141570 Moscow Region, Russia


Abstract
Several optical configurations aiming to create images of sub-millimetre objects with magnification from 1 to 100 have been experimentally tested at the ESRF BM5 beamline. A Kirkpatrick-Baez (KB) System is used for focusing the beam into a 30 microns spot and then direct projection images are recorded. Some results using a spherical crystal downstream from the KB System are presented. The possibility to focus the synchrotron beam into a 40 microns spot using an spherical crystal in quasi-normal incidence is demonstrated and its use for projection microscopy is discussed.



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