| Issue |
J. Phys. IV France
Volume 104, March 2003
|
|
|---|---|---|
| Page(s) | 271 - 271 | |
| DOI | https://doi.org/10.1051/jp4:200300078 | |
J. Phys. IV France 104 (2003) 271
DOI: 10.1051/jp4:200300078
Nano-tomography based on hard X-ray microscopy with refractive lenses
C.G. Schroer1, J. Meyer1, M. Kuhlmann1, B. Benner1, T.F. Günzler1, B. Lengeler1, C. Rau2, T. Weitkamp2, A. Snigirev2 and I. Snigireva21 II. Physikalisches Institut, Aachen University of Technology, 52056 Aachen, Germany
2 European Synchrotron Radiation Facility, ESRF, BP. 220, 38043 Grenoble cedex, France
Without abstract
© EDP Sciences 2003
First page of the article
