Numéro |
J. Phys. IV France
Volume 104, March 2003
|
|
---|---|---|
Page(s) | 267 - 270 | |
DOI | https://doi.org/10.1051/jp4:200300077 |
J. Phys. IV France 104 (2003) 267
DOI: 10.1051/jp4:200300077
Optical configurations for X-ray imaging by projection
L. Alianelli1, 2, M. Sanchez del Rio3, A.Ya. Faenov4, T. Pikuz4, R. Felici1 and O. Hignette31 INFM-OGG, c/o ESRF, BP. 220, 38043 Grenoble cedex, France
2 Institut Laue Langevin, BP. 156, 38046 Grenoble cedex, France
3 European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble cedex, France
4 Multicharged lons Spectra Data Center of VNIIFTRI, Mendeleevo, 141570 Moscow Region, Russia
Abstract
Several optical configurations aiming to create images of sub-millimetre objects with magnification
from 1 to 100 have been experimentally tested at the ESRF BM5 beamline. A Kirkpatrick-Baez (KB) System is
used for focusing the beam into a 30 microns spot and then direct projection images are recorded. Some results
using a spherical crystal downstream from the KB System are presented. The possibility to focus the synchrotron
beam into a 40 microns spot using an spherical crystal in quasi-normal incidence is demonstrated and its use for
projection microscopy is discussed.
© EDP Sciences 2003