| Issue |
J. Phys. IV France
Volume 04, Number C7, Juillet 1994
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique |
|
|---|---|---|
| Page(s) | C7-647 - C7-650 | |
| DOI | https://doi.org/10.1051/jp4:19947153 | |
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-647-C7-650
DOI: 10.1051/jp4:19947153
1 Dipartimento di Energetica, Università di Roma "La Sapienza", Via Scarpa 16, 00161 Roma, Italy
2 Technical University of Moldova, Shtephan Cel Mare, 277012 Kishinev, Moldova
© EDP Sciences 1994
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-647-C7-650
DOI: 10.1051/jp4:19947153
Optical losses characterization in channel waveguide through the photodeflection method
M. Bertolotti1, G. Liakhou2, R. Li Voti1, A. Matera1, C. Sibilia1 and M. Valentino11 Dipartimento di Energetica, Università di Roma "La Sapienza", Via Scarpa 16, 00161 Roma, Italy
2 Technical University of Moldova, Shtephan Cel Mare, 277012 Kishinev, Moldova
Abstract
The photodeflection method applied to the propagation losses characterization in channel waveguides is discussed using two different set-up configurations. 3-D and 1-D models are presented in order to calculate the photodeflection angle. The effects on the measurement of any set-up misalignment are studied. Different ways for determining the propagation losses are shown. Comparison between theoretical and experimental results for Ti : LiNbO3 and a glass channel waveguide is also reported.
© EDP Sciences 1994