| Issue |
J. Phys. IV France
Volume 04, Number C7, Juillet 1994
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique |
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|---|---|---|
| Page(s) | C7-651 - C7-654 | |
| DOI | https://doi.org/10.1051/jp4:19947154 | |
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-651-C7-654
DOI: 10.1051/jp4:19947154
1 Centre d'Etudes Scientifiques et Techniques d'Aquitaine, CEA-CESTA, 33114 Le Barp, France
2 Laboratoire d'Electronique de Technologie et d'Instrumentation, CEA-CENG, 38041 Grenoble, France
© EDP Sciences 1994
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-651-C7-654
DOI: 10.1051/jp4:19947154
Photothermal beam deflection experiment applied to the measurement of directional optical properties of materials
J. Le Gall1, P. Guinet2, M. Olivier1, , J.Y. Le Bris1 and C. Fort11 Centre d'Etudes Scientifiques et Techniques d'Aquitaine, CEA-CESTA, 33114 Le Barp, France
2 Laboratoire d'Electronique de Technologie et d'Instrumentation, CEA-CENG, 38041 Grenoble, France
Abstract
A photothermal deflection experiment with a variable angle pump beam is presented. It is shown that directional absorptivity of rough or corrugated opaque samples can be measured by this technique. As an illustration the absorptivity in p an s polarization of a 2D surface-relief silicon grating is studied. Grating anomalies are detected and qualitatively discussed in the framework of an electromagnetic model.
© EDP Sciences 1994