| Issue |
J. Phys. IV France
Volume 04, Number C7, Juillet 1994
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique |
|
|---|---|---|
| Page(s) | C7-643 - C7-646 | |
| DOI | https://doi.org/10.1051/jp4:19947152 | |
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-643-C7-646
DOI: 10.1051/jp4:19947152
1 Department of Physics and Applied Physics, Strathclyde University, Glasgow G4 ONG, U.K.
2 Quantum Metrology Division, National Physical Laboratory, Teddington TW11 0LW, U.K.
© EDP Sciences 1994
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-643-C7-646
DOI: 10.1051/jp4:19947152
Thermal surface wave technique for thin film thermal diffusivity measurement
B. Zhang1, R.E. Imhof1 and W. Hartree21 Department of Physics and Applied Physics, Strathclyde University, Glasgow G4 ONG, U.K.
2 Quantum Metrology Division, National Physical Laboratory, Teddington TW11 0LW, U.K.
Abstract
A new method of measuring thermal diffusivities of isolated thin films, using variable transverse displacement between focused, modulated optical excitation and radiometric detection, with measurements on metal and plastic foils, is presented.
© EDP Sciences 1994