| Numéro |
J. Phys. IV France
Volume 08, Numéro PR9, December 1998
2nd European Meeting on Integrated FerroelectricsEMIF 2 |
|
|---|---|---|
| Page(s) | Pr9-113 - Pr9-116 | |
| DOI | https://doi.org/10.1051/jp4:1998919 | |
2nd European Meeting on Integrated Ferroelectrics
EMIF 2
J. Phys. IV France 08 (1998) Pr9-113-Pr9-116
DOI: 10.1051/jp4:1998919
1 National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303-3328, U.S.A.
2 U.S. Army Research Laboratory, AMSRL-MA-CC, Aberdeen Proving Ground, MD 21005-5069, U.S.A.
© EDP Sciences 1998
EMIF 2
J. Phys. IV France 08 (1998) Pr9-113-Pr9-116
DOI: 10.1051/jp4:1998919
Microwave dielectric characterization of bulk ferroelectrics
C.M. Weil1, R.G. Geyer1 and L. Sengupta21 National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303-3328, U.S.A.
2 U.S. Army Research Laboratory, AMSRL-MA-CC, Aberdeen Proving Ground, MD 21005-5069, U.S.A.
Abstract
We discuss the application of existing RF measurement techniques, including waveguide and mode-filtered cavity resonator methods, to the dielectric characterization of bulk high-permittivity ferroelectrics at microwave frequencies. Complex permittivity data are presented for barium titanate and a composite of barium strontium titanate (BSTO) and nonferroelectric oxide at X-band (8-11 GHz) frequencies and at 24°C temperature. The advantages and disadvantages of each method are discussed in detail.
© EDP Sciences 1998