| Numéro |
J. Phys. IV France
Volume 06, Numéro C5, Septembre 1996
International Field Emission SocietyIFES'96 Proceedings of the 43rd International Field Emission Symposium |
|
|---|---|---|
| Page(s) | C5-197 - C5-204 | |
| DOI | https://doi.org/10.1051/jp4:1996532 | |
International Field Emission Society
IFES'96
Proceedings of the 43rd International Field Emission Symposium
J. Phys. IV France 06 (1996) C5-197-C5-204
DOI: 10.1051/jp4:1996532
Department of Physics, Chalmers University of Technology, 412 96 Göteborg, Sweden
© EDP Sciences 1996
IFES'96
Proceedings of the 43rd International Field Emission Symposium
J. Phys. IV France 06 (1996) C5-197-C5-204
DOI: 10.1051/jp4:1996532
Atom Probe Field Ion Microscopy of High-Tc Superconductors
H.-O. AndrénDepartment of Physics, Chalmers University of Technology, 412 96 Göteborg, Sweden
Abstract
This paper aims at reviewing the progress within APFIM of high-Tc superconductors during the past ten years. Most of the studies has dealt with the compound YBa2Cu3O6+δ (YBCO), but many other compounds have also been investigated. The development of methods for specimen preparation, FIM imaging and APFIM analysis is described, and studies of interfaces and oxygen ordering are reviewed.
© EDP Sciences 1996