Atom Probe Field Ion Microscopy of High-Tc Superconductors

H.-O. Andrén

doi:doi:10.1051/jp4:1996532

Issue		J. Phys. IV France Volume 06, Number C5, Septembre 1996 International Field Emission Society IFES'96 Proceedings of the 43^rd International Field Emission Symposium


Page(s)		C5-197 - C5-204
DOI		https://doi.org/10.1051/jp4:1996532

International Field Emission Society
IFES'96
Proceedings of the 43^rd International Field Emission Symposium

J. Phys. IV France 06 (1996) C5-197-C5-204
DOI: 10.1051/jp4:1996532

Atom Probe Field Ion Microscopy of High-T_c Superconductors

H.-O. Andrén

Department of Physics, Chalmers University of Technology, 412 96 Göteborg, Sweden

Abstract
This paper aims at reviewing the progress within APFIM of high-T_c superconductors during the past ten years. Most of the studies has dealt with the compound YBa₂Cu₃O_6+δ (YBCO), but many other compounds have also been investigated. The development of methods for specimen preparation, FIM imaging and APFIM analysis is described, and studies of interfaces and oxygen ordering are reviewed.