Journal de Physique IV

Energy-Resolved Field Ion Spectroscopy of Surface Reactions: H₂/O₂ and H₂/H₂O on Platinum p. C5-5

B. Sieben, G. Bozdech et N. Ernst

DOI: https://doi.org/10.1051/jp4:1996501

Applications of Laser Techniques to Field Ion Microscopy p. C5-15

T.T. Tsong

DOI: https://doi.org/10.1051/jp4:1996502

Charged Surfaces, Field Adsorption, and Appearance-Energies: an Unsolved Challenge p. C5-25

R.G. Forbes

DOI: https://doi.org/10.1051/jp4:1996503

Field Desorption Pathways of Water during the H₂- Oxidation on a Pt Field Emitter p. C5-31

W. Drachsel, C. Wesseling et V. Gorodetskii

DOI: https://doi.org/10.1051/jp4:1996504

Theoretical Analysis of a Geis-Spindt Cold Cathode Diamond Emitter p. C5-39

P. Lerner, P.H. Cutler et N.M. Miskovsky

DOI: https://doi.org/10.1051/jp4:1996505

The Liquid Metal Ion Source as an Electrically Driven Vena Contracta, and some Comments on LMIS Stability p. C5-43

R.G. Forbes

DOI: https://doi.org/10.1051/jp4:1996506

A New Approach to Tunneling p. C5-49

L. Yunpeng

DOI: https://doi.org/10.1051/jp4:1996507

Electric Potential and Field Near Pointed Shaped Surfaces p. C5-55

C.F.A. Souza, N.P. Andion et C.M.C. de Castilho

DOI: https://doi.org/10.1051/jp4:1996508

Local Electric Field Variation in the Field Emission Process p. C5-59

A.S.C. Esperidião, N.B. de Oliveira et C.M.C. de Castilho

DOI: https://doi.org/10.1051/jp4:1996509

Self-Consistent Theory of Field Electron Emission from Superconductors p. C5-65

E.A. Litvinov et I.V. Uimanov

DOI: https://doi.org/10.1051/jp4:1996510

Simulations of Modulation of the Current in a Field Emitter Caused by a CW or Pulsed Laser p. C5-71

M.J. Hagmann

DOI: https://doi.org/10.1051/jp4:1996511

Electron Emission Properties of Liquid-Gallium on a Tungsten Field Emitter Tip p. C5-79

K. Hata, F. Nakayama, Y. Saito et A. Ohshita

DOI: https://doi.org/10.1051/jp4:1996512

Silicon Field Emitters Coated with Diamond-Like Carbon p. C5-85

B. Chung, H. Cho, S. Lee, T.-Y. Ko, J.-Y. Lee, D. Jeon, K.-R. Lee, B.K. Joo et M.H. Oh

DOI: https://doi.org/10.1051/jp4:1996513

Field Emission from Pure and Nitrogen-Incorporated Diamond-Like-Carbon Films p. C5-91

S. Lee, B. Chung, T.-Y. Ko, H. Cho, D. Jeon, K.-R. Lee et C.E. Yun

DOI: https://doi.org/10.1051/jp4:1996514

Enhanced Field Emission from Diamond Coated Molybdenum Emitters p. C5-97

W.B. Choi, M.T. McClure, R. Schlesser, Z. Sitar et J.J. Hren

DOI: https://doi.org/10.1051/jp4:1996515

Field Emission from As-Grown and Ion-Beam-Sharpened Diamond Particles Deposited on Silicon Tips p. C5-103

A.N. Stepanova, V.V. Zhirnov, L.V. Bormatova, E.I. Givargizov, E.S. Mashkova et V.A. Molchanov

DOI: https://doi.org/10.1051/jp4:1996516

On the Cold Emission Mechanism of Diamond Coated Tips p. C5-107

V.V. Zhirnov

DOI: https://doi.org/10.1051/jp4:1996517

Peculiarities of Field Electron Emission from CVD Diamond Films p. C5-113

A.V. Karabutov, V.I. Konov, S.M. Pimenov, V.D. Frolov, E.D. Obraztsova, V.I. Polyakov et N.M. Rossukanyi

DOI: https://doi.org/10.1051/jp4:1996518

Peculiarities of the Field Emission with Porous Si Surfaces, Covered by Ultrathin DLC Films p. C5-119

A.A. Evtukh, V.G. Litovchenko, R.I. Marchenko, N.I. Klyui, V.G. Popov et V.A. Semenovich

DOI: https://doi.org/10.1051/jp4:1996519

Single Atom Electron Emission from the Silicon Tip Coated by Calcium Fluoride with Samarium Dopant Ions p. C5-125

V.N. Konopsky, S.K. Sekatskii et V.S. Letokhov

DOI: https://doi.org/10.1051/jp4:1996520

Field - and Photoassisted Field Emission Studies of Calcium Fluoride Coated Silicon Tips p. C5-129

V.N. Konopsky, V.V. Zhirnov, N.S. Sokolov, J.C. Alvarez, E.I. Givargizov, L.V. Bormatova, V.S. Letokhov et S.K. Sekatskii

DOI: https://doi.org/10.1051/jp4:1996521

Field Electron Emission Spectroscopy of YBa₂Cu₃O_6.9 Single Crystals Above and Below Superconducting Transition Temperature p. C5-135

S.N. Ivanov et S.I. Shkuratov

DOI: https://doi.org/10.1051/jp4:1996522

The Dynamic Characteristics of the Field Emission from the Structures with Quantum Wells p. C5-141

V.G. Litovchenko et Y.V. Kryuchenko

DOI: https://doi.org/10.1051/jp4:1996523

Measurements of Modulation of the Current in a Field Emitter caused by a Laser p. C5-147

M. Brugat et M.J. Hagmann

DOI: https://doi.org/10.1051/jp4:1996524

A New Experimental Method of the Determination of the Evaporating Fields p. C5-153

O.L. Golubev

DOI: https://doi.org/10.1051/jp4:1996525

High Temperature Field Evaporation of the Metals and its Correlation with Surface Ionization p. C5-159

O.L. Golubev

DOI: https://doi.org/10.1051/jp4:1996526

Structures of 6H-SiC Surfaces p. C5-167

L. Li, Y. Hasegawa, I.S.T. Tsong et T. Sakurai

DOI: https://doi.org/10.1051/jp4:1996527

Fullerene (C₆₀) Adsorption and Films Growth on the (√3x√3) and (3x3) Surface of 6H SiC(0001) p. C5-173

L. Li, Y. Hasegawa, H. Shinohara et T. Sakurai

DOI: https://doi.org/10.1051/jp4:1996528

STM-HREELS Investigation of C₆₀ on Cu(111) p. C5-179

O. Takaoka, C. Tindall, T. Kobayashi, Y. Hasegawa et T. Sakurai

DOI: https://doi.org/10.1051/jp4:1996529

The Use of STM for Investigation of Surface Relief in Respect to Tribologic Properties of DLC Coatings p. C5-185

V.L. Arbuzov, V.B. Vykhodets, I.Sh. Trakhtenberg, A.E. Davletshin, O.M. Bakunin, S.A. Plotnikov, J.H. Lee, S.J. Kim et B.S. Chung

DOI: https://doi.org/10.1051/jp4:1996530

Scanning Tunneling Microscopy of the Na/Ge(111)3x1 p. C5-189

D. Jeon, T. Hashizume et T. Sakurai

DOI: https://doi.org/10.1051/jp4:1996531

Atom Probe Field Ion Microscopy of High-T_c Superconductors p. C5-197

H.-O. Andrén

DOI: https://doi.org/10.1051/jp4:1996532

Materials Applications of an Advanced 3-Dimensional Atom Probe p. C5-205

A. Cerezo, D. Gibuoin, S. Kim, S.J. Sijbrandij, F.M. Venker, P.J. Warren, J. Wilde et G.D.W. Smith

DOI: https://doi.org/10.1051/jp4:1996533

Atom Probe Studies of Supercooled Liquids p. C5-211

H.G. Read, K. Hono, A.P. Tsai et A. Inoue

DOI: https://doi.org/10.1051/jp4:1996534

Characterization of Bulk Metallic Glasses with the Atom Probe p. C5-217

M.K. Miller, K.F. Russell, P.M. Martin, R. Busch et W.L. Johnson

DOI: https://doi.org/10.1051/jp4:1996535

Phase-Separation, Partitioning and Precipitation in MA956, an ODS Ferritic Stainless Steel p. C5-223

H.G. Read et K. Hono

DOI: https://doi.org/10.1051/jp4:1996536

Clustering Effects Under Irradiation in Fe-0.1%Cu Alloy : An Atomic Scale Investigation with the Tomographic Atom Probe p. C5-229

P. Pareige, S. Welzel et P. Auger

DOI: https://doi.org/10.1051/jp4:1996537

Influence of the Quenching Rate on the Spinodal Decomposition in a Duplex Stainless Steel p. C5-235

M. Hedin, J.P. Massoud et F. Danoix

DOI: https://doi.org/10.1051/jp4:1996538

Characterization of the Effects of Boron and Phosphorus Additions to the Nickel-Based Superalloy 718 p. C5-241

M.K. Miller, J.A. Horton, W.D. Cao et R.L. Kennedy

DOI: https://doi.org/10.1051/jp4:1996539

On APFIM of Grain Boundaries in a Nickel Base Superalloy p. C5-247

M. Thuvander et K. Stiller

DOI: https://doi.org/10.1051/jp4:1996540

Atom-Probe Field-Ion Microscopy Investigation of CMSX-4 Ni-Base Superalloy Laser Beam Welds p. C5-253

S.S. Babu, S.A. David, J.M. Vitek et M.K. Miller

DOI: https://doi.org/10.1051/jp4:1996541

An Atom Probe Field Ion Microscope Study of Model Ni-Al Superalloys Containing Be p. C5-259

R.C. Thomson, K.F. Russell et M.K. Miller

DOI: https://doi.org/10.1051/jp4:1996542

APFIM Characterization of Grain Boundary Segregation in Titanium Carbide-Doped Molybdenum p. C5-265

M.K. Miller et H. Kurishita

DOI: https://doi.org/10.1051/jp4:1996543

Specimen Preparation and Atom Probe Field Ion Microscopy of BSCCO-2212 Superconductors p. C5-271

D.J. Larson, P.P. Camus, J.L. Vargas, T.F. Kelly et M.K. Miller

DOI: https://doi.org/10.1051/jp4:1996544

Characterization of Precipitates with the Atom Probe p. C5-277

M.K. Miller et R.C. Thomson

DOI: https://doi.org/10.1051/jp4:1996545

Construction of STM Aligned Electron Field Emission Source p. C5-285

J.Y. Park, H.-J. Choi, Y. Lee, S. Kang, K. Chun, S.W. Park et Y. Kuk

DOI: https://doi.org/10.1051/jp4:1996546

A New Electronic Detector for FIM and AP : Initial WoW Results p. C5-291

P.P. Camus, D.J. Larson, L.M. Holzman et T.F. Kelly

DOI: https://doi.org/10.1051/jp4:1996547

Characterization of Efficiency Enhancement in Microchannel Plate Detectors p. C5-297

S.J. Sijbrandij, A. Cerezo, B. Deconihout, T.J. Godfrey et G.D.W. Smith

DOI: https://doi.org/10.1051/jp4:1996548

Mass Resolution Enhancement in Local-Electrode Atom Probes : A Preliminary Study Using Field Emitter Arrays p. C5-303

S.S. Bajikar, D.J. Larson, P.P. Camus et T.F. Kelly

DOI: https://doi.org/10.1051/jp4:1996549

Le Journal de Physique IV

Volume 06 / Numéro C5 (Septembre 1996)

International Field Emission SocietyIFES'96Proceedings of the 43rd International Field Emission Symposium

Energy-Resolved Field Ion Spectroscopy of Surface Reactions: H2/O2 and H2/H2O on Platinum p. C5-5