Issue |
J. Phys. IV France
Volume 104, March 2003
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Page(s) | 471 - 476 | |
DOI | https://doi.org/10.1051/jp4:20030125 |
J. Phys. IV France 104 (2003) 471
DOI: 10.1051/jp4:20030125
Magnetic imaging with soft X-ray microscopies
P. Fischer1, G. Denbeaux2, H. Stoll1, A. Puzic1, J. Raabe3, F. Nolting4, T. Eimüller1 and G. Schütz11 Max-Planck-Institute for Metals Research, Heisenbergstr. 1, 70569 Stuttgart, Germany
2 Center for X-Ray Optics, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, U.S.A.
3 University Regensburg, Universitätsstr. 31, 93053 Regensburg, Germany
4 Swiss Light Source, Paul Scherrer Institute, WSLA/120, 5232 Villigen, Switzerland
Abstract
X-ray magnetic circular dichroism yields at inner-core absorption edges large values up to 50%. This
serves as huge magnetic contrast mechanism to image magnetic domain structures. The current status of magnetic
soft X-ray microscopy providing currently a resolution down to about 20nm to study static domain configurations is
demonstrated by selected examples on high magnetostrictive thin films and laterally microstructured elements
measured at the XM-1 microscope at the ALS (Berkeley CA). Element-specificity allows insight into magnetic
coupling mechanisms and the evolution of the domain pattems within full hysteresis loops can be studied by
recording the images within external magnetic fields. Both in-plane and out-of-plane configurations of the
magnetization can be addressed by tilting the sample at an axis perpendicular to the photon propagation direction.
Magnetic X-PEEM measurements obtained at the Swiss Light Source provide complementary information. Spin
dynamics, i.e. precession and relaxation of the magnetization, can be addressed by taking into account the inherent
pulsed time structure of synchrotrons. First results with a sub-100psec time resolution obtained in a stroboscopic
pump-probe experiment with a patterned permalloy element at the XM-1 are reported.
© EDP Sciences 2003