J. Phys. IV France 104 (2003) 477
DOI: 10.1051/jp4:20030126

X-ray magnetic microscopy for correlations between magnetic domains and crystal structure

G. Denbeaux¹, E. Anderson¹, B. Bates¹, W. Chao¹, J.A. Liddle¹, B. Harteneck¹, A. Pearson¹, F. Salmassi¹, G. Schneider¹, P. Fischer², T. Eimüller², S. Taylor³, H. Chang³ and G.J. Kusinski<sup>4

1</sup>  Center for X-Ray Optics, Lawrence Berkeley National Laboratory, Berkeley, California, U.S.A.
²  Max-Planck-Institute for Metals Research, Stuttgart, Germany
³  Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California, U.S.A.
⁴  MMFX Tecnologies, Irvine, CA, U.S.A.

Abstract
Accurately determining the resolution of x-ray microscopes has been a challenge because good test patterns for x-ray microscopy have been hard to make. We report on a sputter-deposited multilayer imaged in cross section as a test pattern with small features and high aspect ratios. One application of high-resolution imaging is magnetic materials. Off-axis bend magnet radiation is known to have a component of circular polarization which can be used for x-ray magnetic circular dichroism. We calculate the integrated circular polarization collected by the illumination optics in the XM-1 full-field x-ray microscope.

© EDP Sciences 2003