J. Phys. IV France
Volume 104, March 2003
Page(s) 271 - 271

J. Phys. IV France
104 (2003) 271
DOI: 10.1051/jp4:200300078

Nano-tomography based on hard X-ray microscopy with refractive lenses

C.G. Schroer1, J. Meyer1, M. Kuhlmann1, B. Benner1, T.F. Günzler1, B. Lengeler1, C. Rau2, T. Weitkamp2, A. Snigirev2 and I. Snigireva2

1  II. Physikalisches Institut, Aachen University of Technology, 52056 Aachen, Germany
2  European Synchrotron Radiation Facility, ESRF, BP. 220, 38043 Grenoble cedex, France

Without abstract

© EDP Sciences 2003
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