| Issue |
J. Phys. IV France
Volume 104, March 2003
|
|
|---|---|---|
| Page(s) | 9 - 9 | |
| DOI | https://doi.org/10.1051/jp4:200300018 | |
J. Phys. IV France 104 (2003) 9
DOI: 10.1051/jp4:200300018
Recent progress with high resolution X-ray microscopy at the XM-1
G. Denbeaux1, G. Schneider1, A. Pearson1, W. Chao1, B. Bates1, B. Harteneck1, D. Olynick1, E. Anderson1, P. Fischer2 and M. Juenger31 Center for X-Ray Optics, Lawrence Berkeley National Laboratory, Berkeley, Califomia, U.S.A.
2 Max-Planck Institute for Metals Research, Stuttgart, Germany
3 Department of Civil and Environmental Engineering, U.C. Berkeley, Berkeley, California, U.S.A.
Without abstract
© EDP Sciences 2003
First page of the article
