J. Phys. IV France 104 (2003) 11
DOI: 10.1051/jp4:200300019

The 2-ID-B intermediate-energy scanning X-ray microscope at the APS

I. McNulty¹, D. Paterson¹, J. Arko¹, M. Erdmann¹, S.P. Frigo², K. Goetze¹, P. Ilinski¹, N. Krapf³, T. Mooney¹, C.C. Retch⁴, A.P.J. Stampfl⁵, S. Vogt¹, Y. Wang⁶ and S. Xu<sup>1

1</sup>  Argonne National Laboratory, 9700 S. Cass Ave., Argonne, IL 60439, U.S.A.
²  Department of Physicsand Astronomy, Northern Arizona University, P.O. Box 6010, Flagstaff, AZ 86011, U.S.A.
³  Department of Physics, University of Chicago, Chicago, IL 60637, U.S.A.
⁴  Saint-Gobain Sekurit Deutschland, ZAF - PT, Glasstrasse 1, 52134 Herzogenrath, Germany
⁵  Physics Division, Australian Nuclear Science and Technology Organisation, Menai, NSW 2234, Australia
⁶  X-Radia Inc., 4075A Sprig Dr., Concord, CA 94520, U.S.A.

Abstract
The intermediate-energy scanning x-ray microscope at beamline 2-ID-B at the Advanced Photon Source is a dedicated instrument for materials and biological research. The microscope uses a zone plate lens to focus coherent 1-4 keV x-rays to a 60 nm focal spot of 10 ⁹ photons/s onto the sample. It records simultaneous transmission and energy-resolved fluorescence images. We have used the microscope for nanotomography of chips and microspectroscopy of cells.

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