| Issue |
J. Phys. IV France
Volume 03, Number C7, Novembre 1993
The 3rd European Conference on Advanced Materials and ProcessesTroisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés |
|
|---|---|---|
| Page(s) | C7-41 - C7-48 | |
| DOI | https://doi.org/10.1051/jp4:1993704 | |
The 3rd European Conference on Advanced Materials and Processes
Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés
J. Phys. IV France 03 (1993) C7-41-C7-48
DOI: 10.1051/jp4:1993704
IBM Research Division, Zurich Research Laboratory, Säumerstr. 4, 8803 Rüschlikon, Switzerland
© EDP Sciences 1993
Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés
J. Phys. IV France 03 (1993) C7-41-C7-48
DOI: 10.1051/jp4:1993704
Scanning tunneling microscopy
J.K. GIMZEWSKIIBM Research Division, Zurich Research Laboratory, Säumerstr. 4, 8803 Rüschlikon, Switzerland
Abstract
A brief review of the state-of-the-art of scanning tunneling microscopy (STM) is presented with emphasis on materials problems. I shall discuss in particular the variety of materials, environrnents and temperatures that can be investigated. In addition to topographie studies, some examples of STM as local probe are given. It is proposed that STM be increasingly incorporated as a technique for investigation of real materials problems.
© EDP Sciences 1993