Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés
J. Phys. IV France 03 (1993) C7-41-C7-48
Scanning tunneling microscopyJ.K. GIMZEWSKI
IBM Research Division, Zurich Research Laboratory, Säumerstr. 4, 8803 Rüschlikon, Switzerland
A brief review of the state-of-the-art of scanning tunneling microscopy (STM) is presented with emphasis on materials problems. I shall discuss in particular the variety of materials, environrnents and temperatures that can be investigated. In addition to topographie studies, some examples of STM as local probe are given. It is proposed that STM be increasingly incorporated as a technique for investigation of real materials problems.
© EDP Sciences 1993