| Numéro |
J. Phys. IV France
Volume 01, Numéro C6, Décembre 1991
Beam Injection Assessment of Defects in Semiconductors2nd International Workshop |
|
|---|---|---|
| Page(s) | C6-295 - C6-296 | |
| DOI | https://doi.org/10.1051/jp4:1991644 | |
Beam Injection Assessment of Defects in Semiconductors
2nd International Workshop
J. Phys. IV France 01 (1991) C6-295-C6-296
DOI: 10.1051/jp4:1991644
Departamento de Física de Materiales, Facultad de Físicas, Universidad Complutense, SP-28040 Madrid, Spain
© EDP Sciences 1991
2nd International Workshop
J. Phys. IV France 01 (1991) C6-295-C6-296
DOI: 10.1051/jp4:1991644
CHARACTERIZATION OF SEMIINSULATING GaAs : Cr BY SCANNING ELECTRON ACOUSTIC MICROSCOPY
B. MÉNDEZ and J. PIQUERASDepartamento de Física de Materiales, Facultad de Físicas, Universidad Complutense, SP-28040 Madrid, Spain
Without abstract
© EDP Sciences 1991
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