J. Phys. IV France 12 (2002) Pr3-71
Temperature dependence of generation-recombination noise in p-n junctionsJ.A. Jiménez Tejada, A. Godoy, A. Palma and P. Cartujo
Departamento Electronica y Tecnologia de Computadores, Facultad de Ciencias, Universidad de Granada, Avenida Fuentenueva s/n, 18071 Granada, Spain
Fundamental aspects of the p-n junction have been considered in order to obtain an analytical model for generation-recombination (g-r) current noise. Considering neutrality and fixed-bias voltage conditions a fluctuation in the charge trapped in deep levels is related to fluctuations of the charge density and the electric field at the borders of the space-charge region. These variations are then converted to current fluctuations making use of a collective transport noise theory. Generation-recombination current noise in p-n junctions is analyzed at low and high temperatures for different bias conditions.
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