Numéro |
J. Phys. IV France
Volume 107, May 2003
|
|
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Page(s) | 103 - 106 | |
DOI | https://doi.org/10.1051/jp4:20030254 |
J. Phys. IV France 107 (2003) 103
DOI: 10.1051/jp4:20030254
Bismuth film microelectrodes for heavy metals monitoring by anodic stripping voltammetry
M.A. Baldo, S. Daniele and C. BragatoDepartment of Physical Chemistry, University of Venice, Calle Larga S. Marta 2137, 30123 Venice, Italy
Abstract
The preparation of bismuth film microelectrodes (BiF
E), and their subsequent application to heavy
metal analysis by the anodic stripping voltammetric (ASV) technique are presented. The BiF
E are prepared by
electrodeposition of a Bi film onto carbon and platinum disk microelectrodes, by applying both ex-situ and in-situ
electroplating procedures. The analytical performance of such systems in stripping analysis is evaluated on
synthetic solutions containing Cd
2+ and Pb
2+ as target ions. Firstly, the results obtained show that both carbon and
platinum microdisks are suitable substrates for Bi-film formation, and that the BiF
E's obtained with both the
deposition procedures are effective for heavy metal deposition. The BiF
E's prepared by the in-situ procedure on
graphite gave the best analytical performance, in particular in terms of data reproducibility and linear range of the
calibration curves. In this case, using the square wave voltammetry in the stripping step, linear calibration graphs
for Cd
2+ and Pb
2+ over the concentration range
M are obtained, with a RSD, at
M level,
within 4% (n=7). The performance of such BiF
E's for trace metal analysis in real samples is also tested, and
reliable data for monitoring of lead in some food products are obtained.
© EDP Sciences 2003