J. Phys. IV France
Volume 104, March 2003
Page(s) 41 - 44

J. Phys. IV France
104 (2003) 41
DOI: 10.1051/jp4:200300025

High-sensitive imaging with scanning transmission hard X-ray microscope

H. Takano, K. Uesugi, A. Takeuchi, K. Takai and Y. Suzuki

JASRI/SPring-8, 1-1-1 Kouto, Mikazuki, Hyogo 679-5198, Japan

High-sensitive differential phase imaging has been performed with hard x-ray scanning transmission microscope optics and an imaging detector. A microbeam with the size of 160 nm at 8 keV x-ray is generated by highly-coherent illuminated beam at x-ray undulator beamline BL20XU of SPring-8. The differential phase image is reconstructed by data set consists of diffraction images of each scan position. Advantages for absorption imaging are shown with some objects.

© EDP Sciences 2003