| Numéro |
J. Phys. IV France
Volume 104, March 2003
|
|
|---|---|---|
| Page(s) | 41 - 44 | |
| DOI | https://doi.org/10.1051/jp4:200300025 | |
J. Phys. IV France 104 (2003) 41
DOI: 10.1051/jp4:200300025
High-sensitive imaging with scanning transmission hard X-ray microscope
H. Takano, K. Uesugi, A. Takeuchi, K. Takai and Y. SuzukiJASRI/SPring-8, 1-1-1 Kouto, Mikazuki, Hyogo 679-5198, Japan
Abstract
High-sensitive differential phase imaging has been performed with hard x-ray scanning transmission
microscope optics and an imaging detector. A microbeam with the size of 160 nm at 8 keV x-ray is generated by
highly-coherent illuminated beam at x-ray undulator beamline BL20XU of SPring-8. The differential phase image
is reconstructed by data set consists of diffraction images of each scan position. Advantages for absorption imaging
are shown with some objects.
© EDP Sciences 2003