Numéro |
J. Phys. IV France
Volume 104, March 2003
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Page(s) | 35 - 40 | |
DOI | https://doi.org/10.1051/jp4:200300024 |
J. Phys. IV France 104 (2003) 35
DOI: 10.1051/jp4:200300024
Hard X-ray microscopy activities at SPring-8
Y. Suzuki1, M. Awaji1, A. Takeuchi1, H. Takano1, K. Uesugi1, Y. Kohmura1, N. Kamijo2, M. Yasumoto2 and S. Tamura31 SPring-8, Mikazuki, Hyogo 679-5198, Japan
2 Kansai Medical University, Hirakata Osaka 573-1136, Japan
3 Photonics Research Institute, AIST Tsukuba, Tsukuba, Ibaraki 305-8568, Japan
Abstract
Development of microfocusing optics for scanning microscopy and image forming optics for imaging
microscopy are now in progress in SPring-8 by using varieties of optical devices: refractive lens, total reflection
mirrors. Fresnel zone plates, and sputtered-sliced Fresnel one plates. Spatial resolution of 100 nm has been
achieved in scanning microscopy using highly coherent X-ray beam at a 248 m-long beamline 20XU and FZP
focusing optics. Recent results on development of optical systems are described.
© EDP Sciences 2003