| Numéro |
J. Phys. IV France
Volume 10, Numéro PR6, April 2000
The Sixth Japan-France Materials Science SeminarJFMSS-6 Microstructural Design for Improved Mechanical Behaviour of Advanced Materials |
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|---|---|---|
| Page(s) | Pr6-97 - Pr6-103 | |
| DOI | https://doi.org/10.1051/jp4:2000617 | |
JFMSS-6
Microstructural Design for Improved Mechanical Behaviour of Advanced Materials
J. Phys. IV France 10 (2000) Pr6-97-Pr6-103
DOI: 10.1051/jp4:2000617
Application of HRTEM to studies of electronic structure and atomic configuration of interface in SiC/SiC composites
T. Shibayama1, G.W. He1, Heishichiro Takahashi1 and A. Kohyama21 Center for Advanced Research of Energy Technology, Hokkaido University, Sapporo 060-8628, Japan
2 Institute of Advanced Energy, Kyoto University, Uji 611-0011, Japan
Abstract
The continuous fiber ceramic composite (CFCC), such as SiC/SiC composites have attractive features for advanced energy conversion and production systems, especially gas turbines and fusion power reactors. Because SiC is well known to exhibit a quite fast decay behavior and an excellent oxidation resistance behavior due to the formation of a passive SiO2, layer. The variety of criteria for environmental effects of microstructural evolution at interface of SiC/SiC composites is proposed. Of interest is that the degradation of the composite is observed after annealed at 1500°C under ultra high purity Ar flow condition. However there are few data of nano-structure analyses at interface of SiC/SiC composites. In this work, the environmental effects of microstructural evolution in SiC/SiC composites are examined by a Field Emission type High-Resolution Electron Microscopy (FE-HRTEM) and a Parallel Electron Energy Loss Spectroscopy (PEELS). A possible mechanism for this degradation is discussed and proposed.
© EDP Sciences 2000