Numéro
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
Page(s) C2-171 - C2-177
DOI https://doi.org/10.1051/jp4/1997156
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-171-C2-177

DOI: 10.1051/jp4/1997156

Short-Range Structure in Solid and Liquid Matter Using Multiple-Edge EXAFS Refinement

A. Di Cicco

Dipartimento di Matematica e Fisica Università di Camerino, Via Madonna delle Carceri, I-62032 Camerino (MC) Italy


Abstract
A novel data-analysis approach for simultaneous analysis of EXAFS (Extended X-ray Absorption Fine Structure) spectra recorded at different core-level edges in monatomic and multiatomic systems is presented. This approach is based on the ab initio multiple-scattering GNXAS method and allows to perform a multiple-edge refinement of the local structure. The usefulness of the method for structural analysis of monatomic and binary liquids is discussed. Applications on K and L edges of solid and liquid Sn and RbBr are reported. The short-range pair distribution g(r) is accurately determined and compared with previous diffraction and molecular-dynamics results.



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