J. Phys. IV France
Volume 7, Numéro C2, Avril 1997Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
|Page(s)||C2-1133 - C2-1134|
J. Phys. IV France 7 (1997) C2-1133-C2-1134
M3,2 and L3,2 XAFS of Au and Pt Nanoparticles on Porous SiliconI. Coulthard1, A. Bzowski1, T.K. Sham1, S.M. Heald2 and M. Kuhn3
1 Department of Chemistry, University of Western Ontario, London, N6A 5B7, Canada
2 Pacific Northwest Laboratory, Richland, WA, U.S.A.
3 Physics Department, Tulane University, New Orleans, LA, U.S.A.
XAFS measurements at both the M3,2 and L3,2 edges of Pt and Au as well as scanning electron microscopy studies have been carried out for a series of porous silicon specimens onto which fine particles of Au and Pt with nanometre and tens of nanometre dimensions have been dispersed. A wet chemistry technique developed in our laboratory was used for the deposition. The Au XAFS clearly show that the Au deposits are essentially Au metal while the Pt deposits exhibit features that are noticeably different from that of metallic Pt. The M3,2 and L3,2 the XANES and their implications are discussed.
© EDP Sciences 1997