J. Phys. IV France
Volume 7, Numéro C2, Avril 1997Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
|Page(s)||C2-485 - C2-487|
J. Phys. IV France 7 (1997) C2-485-C2-487
Aluminum K Edge XAFS of Gibbsite and Related CompoundsK.R. Bauchspieiß1, 2, T. Murata3, G. Parkinson1, P. Sipos4 and H. Watling5
1 School of Applied Chemistry, Curtin University of Technology, G.P.O. Box U 1987, Perth W.A. 6001, Australia
2 Dept. of Physics, Simon Fraser University, Bumafay BC V5A 1S6, Canada.
3 Dept. of Physics, Kyoto University of Education, Fukakusa, Fushimi, Kyoto 612, Japan
4 Dept. of Chemistry, Murdoch University, Murdoch W.A. 6150, Australia
5 CSIRO Division of Minerals, Waterford W.A. 6152, Australia
X-ray absorption spectra have been measured in total-electron yield mode at the aluminum K edge in gibbsite and related compounds. The experiments were carried out at the UVSOR storage ring in Okazaki, Japan, which is particularly suitable for these measurements because of its relatively tow intensity which permits the use of a quartz monochromator without causing radiation damage to the quartz. It is shown that XAFS spectra of good quality can be obtained.
© EDP Sciences 1997