Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-511-C2-512
DOI: 10.1051/jp4/1997074

Progress in 1-2 KeV Spectroscopy using a YB₆₆ Monochromator

J. Wong¹, M. Fröba^{1, 2}, E. Tamura¹, M. Rowen³, Z. Rek³ and T. Tanaka<sup>4

1</sup>  Lawrence Livermore National Laboratory, University of California, P.O. Box 808, Livermore CA94551, U.S.A.
²  Institute of Inorganic and Applied Chemistry, University of Hamburg, Martin-Luther-King Platz 6, 20146 Hamburg, Germany
³  Stanford Synchrotron Radiation Laboratory, P. O. Box 4349, Stanford CA-94309, U.S.A.
⁴  National Institute for Research in Inorganic Materials, Tsukuba, Iharaki 305, Japan

Abstract
This report summarizes XAFS investigations, particularly in the XANES region, performed to date on a variety of materials containing Si, Al and Mg using a double-crystal YBg₆₆ monochromator in the 1-2 keV region.

© EDP Sciences 1997