EDP Sciences Journals List
Issue J. Phys. IV France
Volume 7, Number C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
Page(s) C2-511 - C2-512
DOI http://dx.doi.org/10.1051/jp4/1997074

Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-511-C2-512

DOI: 10.1051/jp4/1997074

Progress in 1-2 KeV Spectroscopy using a YB66 Monochromator

J. Wong1, M. Fröba1, 2, E. Tamura1, M. Rowen3, Z. Rek3 and T. Tanaka4

1  Lawrence Livermore National Laboratory, University of California, P.O. Box 808, Livermore CA94551, U.S.A.
2  Institute of Inorganic and Applied Chemistry, University of Hamburg, Martin-Luther-King Platz 6, 20146 Hamburg, Germany
3  Stanford Synchrotron Radiation Laboratory, P. O. Box 4349, Stanford CA-94309, U.S.A.
4  National Institute for Research in Inorganic Materials, Tsukuba, Iharaki 305, Japan


Abstract
This report summarizes XAFS investigations, particularly in the XANES region, performed to date on a variety of materials containing Si, Al and Mg using a double-crystal YBg66 monochromator in the 1-2 keV region.



© EDP Sciences 1997