Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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Page(s) | C2-427 - C2-429 | |
DOI | https://doi.org/10.1051/jp4/1997036 |
J. Phys. IV France 7 (1997) C2-427-C2-429
DOI: 10.1051/jp4/1997036
Spin Polarization of Photoelectrons from Si(001)
A. Chassé and P. RennertDepartment of Physics, Martin-Luther-University Halle-Wittenberg, 06099 Halle (Saale), Germany
Abstract
Si 2p core photoelectron spectra are calculated for Si(001) for different elliptical polarization of the
incident radiation and normal incidence. The degree of the elliptical polarization is varied continuously from right to
left circularly polarized light including different cases of linear polarization [100], [110], [010] and
, Due to the
surface the cubic C4 screw axis and the (100) glide plane disappear. There remain a C2 axis and the mirror planes
(100) and
. Thus we get different intensities for the polarizations [110] and
, respectively. Due to the mirror
planes (Φ1 = 450; 1350) the relation [formula : see text] connects the intensities of
spin up and spin down electrons. The angles or and { describe the direction of the polarization. This relation is an
essential view of the spin polarization. Results are presented in dependence on the azimuth angle Φ for fixed polar
angle θ with respect to the surface normal direction.
© EDP Sciences 1997