Issue
J. Phys. IV France
Volume 7, Number C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
Page(s) C2-427 - C2-429
DOI https://doi.org/10.1051/jp4/1997036
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-427-C2-429

DOI: 10.1051/jp4/1997036

Spin Polarization of Photoelectrons from Si(001)

A. Chassé and P. Rennert

Department of Physics, Martin-Luther-University Halle-Wittenberg, 06099 Halle (Saale), Germany


Abstract
Si 2p core photoelectron spectra are calculated for Si(001) for different elliptical polarization of the incident radiation and normal incidence. The degree of the elliptical polarization is varied continuously from right to left circularly polarized light including different cases of linear polarization [100], [110], [010] and $[\bar{1}10]$, Due to the surface the cubic C4 screw axis and the (100) glide plane disappear. There remain a C2 axis and the mirror planes (100) and $(\bar{1}10)$. Thus we get different intensities for the polarizations [110] and $[\bar{1}10]$, respectively. Due to the mirror planes (Φ1 = 450; 1350) the relation [formula : see text] connects the intensities of spin up and spin down electrons. The angles or and { describe the direction of the polarization. This relation is an essential view of the spin polarization. Results are presented in dependence on the azimuth angle Φ for fixed polar angle θ with respect to the surface normal direction.



© EDP Sciences 1997