Numéro
J. Phys. IV France
Volume 06, Numéro C5, Septembre 1996
International Field Emission Society
IFES'96
Proceedings of the 43rd International Field Emission Symposium
Page(s) C5-189 - C5-194
DOI https://doi.org/10.1051/jp4:1996531
International Field Emission Society
IFES'96
Proceedings of the 43rd International Field Emission Symposium

J. Phys. IV France 06 (1996) C5-189-C5-194

DOI: 10.1051/jp4:1996531

Scanning Tunneling Microscopy of the Na/Ge(111)3x1

D. Jeon1, T. Hashizume2 and T. Sakurai3

1  Department of Physics, Myong Ji University, Yongin, Kyunggi-Do, Seoul 449-728, Korea
2  Advanced Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-03, Japan
3  Institute for Materials Research, Tohoku University, Sendai 980, Japan


Abstract
The structure of the Na/Ge(111) surface has been studied using scanning tunneling microscopy. Na atoms adsorbed preferentially on the domain boundaries and defect sites. At the increased coverage, Na atoms did not form an ordered structure. When the Na-adsorbed surface was annealed, the surface reconstructed to the 3x1 structure. The atomic arrangement of the 3x1 surface was similar to that of the Na/Si(111)3x1 surface.



© EDP Sciences 1996