Numéro |
J. Phys. IV France
Volume 04, Numéro C7, Juillet 1994
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique |
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Page(s) | C7-299 - C7-302 | |
DOI | https://doi.org/10.1051/jp4:1994771 |
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-299-C7-302
DOI: 10.1051/jp4:1994771
Department of Physics and Applied Physics, Strathclyde University, Glasgow G4 ONG, U.K.
© EDP Sciences 1994
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-299-C7-302
DOI: 10.1051/jp4:1994771
Transient surface grating technique for thermal diffusivity measurement
M. Alam, R.E. Imhof and B. ZhangDepartment of Physics and Applied Physics, Strathclyde University, Glasgow G4 ONG, U.K.
Abstract
A new transient surface grating technique specifically designed for measuring thermal
diffusivities of condensed materials is described. Its capabilities are illustrated with measurements
of the thermal diffusivities of copper and glass.
© EDP Sciences 1994