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Foreword
Issue |
J. Phys. IV France
Volume 104, March 2003
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Page(s) | V - V |
7th International Conference on X-Ray Microscopy
J. Susini, D. Joyeux, F. Polack
J. Phys. IV France 104 (2003) Pr2-V
© EDP Sciences 2003
J. Susini, D. Joyeux, F. Polack
J. Phys. IV France 104 (2003) Pr2-V
Preface
J. Susini, D. Joyeux and F. Polack Résumé
This volume is the proceedings of the 7th X-ray microscopy conference, hosted by the ESRF, in Grenoble,
from July 28th to August 2nd 2002. This triennial conference is the latest in a series of several conferences
held successively in Gottingen (1983), Brookhaven (1987), London (1990), Chemogolovka (1993),
Wurzburg (1996) and Berkeley (1999). The meeting series has become the principal international forum
for the presentation and discussion of advances in high-spatial-resolution X-ray imaging and its
applications across a broad range of sciences. XRM2002 was jointly supported by the ESRF, LURE and
SOLEIL and attracted 239 participants from 18 nations.
© EDP Sciences 2003