Issue
J. Phys. IV France
Volume 09, Number PR10, December 1999
International Workshop on Electronic Crystals
ECRYS-99
Page(s) Pr10-17 - Pr10-21
DOI https://doi.org/10.1051/jp4:19991004
International Workshop on Electronic Crystals
ECRYS-99

J. Phys. IV France 09 (1999) Pr10-17-Pr10-21

DOI: 10.1051/jp4:19991004

Dynamic scaling during CDW relaxation from the sliding state

J.D. Brock1, K.L. Ringland1, A.C. Finnefrock1, Y. Li1, S.G. Lemay2 and R.E. Thorne2

1  School of Applied and Engineering Physics, Cornell University, Ithaca, NY, U.S.A.
2  Department of Physics, Cornell University, Ithaca, NY, U.S.A.


Abstract
Using time-resolved high-resolution x-ray scattering techniques, we have measured the evolution of the structure of the Q1 charge-density wave in NbSe3 as it relaxes after an applied electric field is turned off. Measurements were made at temperatures between 70 and 120 K and at applied field strengths up to 40x the threshold for sliding. These time-dependent structural data are accurately described by dynamic scaling theory. For threshold field strengths less than the threshold to sliding, the value of the dynamic scaling exponent µ is consistent with the value predicted by assuming that the CDW is an elastic medium. However, for field strengths greater than threshold, µ is significantly smaller, indicating that phase-slip (amplitude fluctuations) is (are) necessary for a correct physical description.



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