| Numéro |
J. Phys. IV France
Volume 09, Numéro PR10, December 1999
International Workshop on Electronic CrystalsECRYS-99 |
|
|---|---|---|
| Page(s) | Pr10-151 - Pr10-152 | |
| DOI | https://doi.org/10.1051/jp4:19991038 | |
International Workshop
on Electronic Crystals
ECRYS-99
J. Phys. IV France 09 (1999) Pr10-151-Pr10-152
DOI: 10.1051/jp4:19991038
1 School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, U.S.A.
2 Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853, U.S.A.
3 Cornell High-Energy Synchrotron Source (CHESS), Ithaca, NY 14853, U.S.A.
© EDP Sciences 1999
ECRYS-99
J. Phys. IV France 09 (1999) Pr10-151-Pr10-152
DOI: 10.1051/jp4:19991038
Imaging field-dependent structure in charge-density waves by X-ray diffraction topography
Y. Li1, S.G. Lemay2, J.H. Price1, K. Cicak2, K. O'Neill2, K. Ringland2, K.D. Finkelstein3, J.D. Brock1 and R.E. Thorne21 School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, U.S.A.
2 Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853, U.S.A.
3 Cornell High-Energy Synchrotron Source (CHESS), Ithaca, NY 14853, U.S.A.
Abstract
We have imaged field-dependent CDW structure in NbSe3 single crystals by X-ray diffraction topography.
Just above ET, the CDW shears along longitudinal steps in crystal thickness associated with small-angle grain
boundaries, and at high fields transverse correlations recover. These results demonstrate X-ray topography as an effective
probe of CDW structure, and together with earlier transport measurements establish that extrinsic sources
dominate the most obvious manifestations of plasticity in this CDW conductor.
© EDP Sciences 1999