Issue
J. Phys. IV France
Volume 08, Number PR9, December 1998
2nd European Meeting on Integrated Ferroelectrics
EMIF 2
Page(s) Pr9-3 - Pr9-15
DOI https://doi.org/10.1051/jp4:1998901
2nd European Meeting on Integrated Ferroelectrics
EMIF 2

J. Phys. IV France 08 (1998) Pr9-3-Pr9-15

DOI: 10.1051/jp4:1998901

Effects of constrained geometries and fast access times in real ferroelectric memory devices

J.F. Scott and A.J. Hartmann

Schools of Physics and Chemistry, University of New South Wales, Sydney 2052, Australia


Abstract
A status report is given on the physical limitations imposed by both thickness and cross-sectional area in ferroelectric thin films in ferroelectric memories.



© EDP Sciences 1998