Issue |
J. Phys. IV France
Volume 7, Number C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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Page(s) | C2-331 - C2-332 | |
DOI | https://doi.org/10.1051/jp4/1997216 |
J. Phys. IV France 7 (1997) C2-331-C2-332
DOI: 10.1051/jp4/1997216
Reflective Optics for the ESRF Beamline ID 26
R. Signorato1, J. Susini1, J. Goulon1, Ch. Gauthier2 and Ph. Marion11 ESRF, BP. 220, avenue des Martyrs, 38043 Grenoble cedex 9, France
2 ESRF, BP. 220, avenue des Martyrs, 38043 Grenoble cedex. France
Abstract
The ESRF beamline ID26 is dedicated to XAFS studies on ultra-diluted samples in the energy
range 2.5-25 KeV using the excitation of X-ray fluorescence. The source consists of three phasable planar
undulators, inserted in an high β section of the storage ring. The optical design, based on grazing incidence
mirrors, aims at obtaining a highly stable clean beam with efficient harmonic rejection together with small
vertical and horizontal focal spot sizes. The heat load associated with unwanted high energies is dump in the
less critical component, i.e. the first mirror. The latter is a flat Si mirror which acts as a heat sink, introduces
a cut-off at high energy and steers the beam out of the brehmsstrahlung emission cone of the straight
section. Horizontal and vertical focusing are performed separately by a couple of piezoelectric (PZT) mirrors
in a classical Kirkpatrick-Baez configuration. To overcome the limitation due to the maximum length of the
commercially available PZT ceramics (150 mm), several plates have been assembled side to side thus
allowing a much wider angular acceptance. A wavefront sensor will provide in-situ monitoring of the mirrors
shape. Ray-tracing simulations (using the computer code Shadow) show that theoretical focal spot sizes as
small as 106x8 µm² FWHM could in principle be obtained.
© EDP Sciences 1997