| Issue |
J. Phys. IV France
Volume 7, Number C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-145 - C2-146 | |
| DOI | https://doi.org/10.1051/jp4/1997144 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-145-C2-146
DOI: 10.1051/jp4/1997144
1 Faculty of Science, Chiba University, Inage, Chiba263, Japan
2 Faculty of Engineering, Yokohama National University, Hodogaya, Yokohama 240, Japan
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-145-C2-146
DOI: 10.1051/jp4/1997144
Theory of Spherical-Wave Debye-Waller Factors in Photoelectron Diffraction Spectra Compared with that in EXAFS
T. Fujikawa1 and T. Yanagawa21 Faculty of Science, Chiba University, Inage, Chiba263, Japan
2 Faculty of Engineering, Yokohama National University, Hodogaya, Yokohama 240, Japan
Abstract
A new approach is applied to Ihe analyses of thermal effects in ARXPS ( photoelectron diffraction )
spectra, where we include both spherical wave correction and anharmonic vibration effects. A .partial summation
technique is applied to get a plane wave part and a spherical wave part( dynamical spherical wave effect ).
Numerical calculations illustrate the importance of the spherical wave effects in high energy ARXPS spectra. In
particular the spherical wave effects play an important role in the small-angle scatterings which predominate in
the ARXPS processes. In comparison with the dynamical spherical wave effects in EXAFS those in ARXPS only
reduce the intensities whereas the phase is unchanged.
© EDP Sciences 1997