| Issue |
J. Phys. IV France
Volume 7, Number C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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| Page(s) | C2-1251 - C2-1252 | |
| DOI | https://doi.org/10.1051/jp4:19972218 | |
J. Phys. IV France 7 (1997) C2-1251-C2-1252
DOI: 10.1051/jp4:19972218
XAFS Study of CdTe1-xSx Semiconductor Glass Composites
M.C. Martins Alves1, O.L. Alves2, L.C. Barbosa3, A.F. Craievich1, A. Ramos4 and A. Traverse51 LNLS, Caixa Postal 6192, 13081-970 Campinas SP, Brazil
2 LQES, IQ, UNICAMP, P.O. Box 6154, 13081-970, Campinas SP, Brazil
3 LMV, IF, UNIKAMP, P.O. Box 6165, 13081-970 Campinas SP, Brazil
4 LMCP, Case 115, 4 place Jussieu, 75252 Paris cedex 05, France
5 LURE, Bât. 2090, 91405 Orsay, France
Abstract
We have measured the X-ray absorption spectra of CdTe1-xSx nanocrystals grown in a borosilicate matrix, for x = 0, 0.1, 0.4 and 0.7. The appearance and the growth of the nanocrystals in isothermal heat-treatment at 580°C, observed in optical rneasurements, were correlated to the evolution of the XANES at the cadmium edge corresponding to the progressive substitution of oxygen atoms by chalcogens atoms. The final mean environment of the cadmium atoms in nanocrystals seems to be closer to CdS than to CdTe, for any value of x. On the other hand significant deviations from CdO pure environment were observed in non-treated samples, correlated to the increase in the sulfur content in the initial glass. These features were ascribed to the existence of early CdS clusters.
© EDP Sciences 1997