Issue |
J. Phys. IV France
Volume 06, Number C5, Septembre 1996
International Field Emission SocietyIFES'96 Proceedings of the 43rd International Field Emission Symposium |
|
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Page(s) | C5-277 - C5-282 | |
DOI | https://doi.org/10.1051/jp4:1996545 |
International Field Emission Society
IFES'96
Proceedings of the 43rd International Field Emission Symposium
J. Phys. IV France 06 (1996) C5-277-C5-282
DOI: 10.1051/jp4:1996545
1 Microscopy and Microanalytical Sciences Group, Metals and Ceramics Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831-6376, U.S.A.
2 Loughborough University, Loughborough, Leicestershire LE11 3TU, U.K.
© EDP Sciences 1996
IFES'96
Proceedings of the 43rd International Field Emission Symposium
J. Phys. IV France 06 (1996) C5-277-C5-282
DOI: 10.1051/jp4:1996545
Characterization of Precipitates with the Atom Probe
M.K. Miller1 and R.C. Thomson21 Microscopy and Microanalytical Sciences Group, Metals and Ceramics Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831-6376, U.S.A.
2 Loughborough University, Loughborough, Leicestershire LE11 3TU, U.K.
Abstract
The parameters that can be measured from atom probe random area analyses of small spherical precipitates and platelets have been examined with a combination of simulation and geometrical models. The results indicate that the probe aperture should be less than 50% of the diameter of the precipitate in order to reliable measure the true composition in a significant proportion of precipiates.
© EDP Sciences 1996