The Off-Stoichiometric Bi1.8Pb0.3Sr2Ca2Cu3.3Ox Target for Thin Films

A. Harabor; R. Deltour; M. Ye; J. Schroeder; G. Moortgat; M. Deletter

doi:doi:10.1051/jp4:1996343

Issue		J. Phys. IV France Volume 06, Number C3, Avril 1996 WOLTE 2 Proceedings of the Second European Workshop on Low Temperature Electronics


Page(s)		C3-283 - C3-288
DOI		https://doi.org/10.1051/jp4:1996343

WOLTE 2
Proceedings of the Second European Workshop on Low Temperature Electronics

J. Phys. IV France 06 (1996) C3-283-C3-288
DOI: 10.1051/jp4:1996343

The Off-Stoichiometric Bi_1.8Pb_0.3Sr₂Ca₂Cu_3.3O_x Target for Thin Films

A. Harabor¹, R. Deltour¹, M. Ye¹, J. Schroeder¹, G. Moortgat² and M. Deletter²

¹ Physique des Solides, Université Libre de Bruxelles, Campus Plaine, CP233, Bruxelles, Belgium
² Centre de Recherche de l'Industrie Belge de la Céramique, 7000 Mons, Belgium

Abstract
X-ray diffraction (XRD), EDAX, AC susceptibility and resistivity measurements has been used as characterization methods for the Bi-2223 monophase target with the starting stoichiometry Bi_1.8Pb_0.3Sr₂Ca₂Cu_3.3O_x. Pressure parameter is playing an important role in obtaining good superconducting properties for this compound. Critical currents and activation energy has been calculated from susceptibility and magnetoresistivity curves, respectively. The results could be interpreted in terms of TAPS and TAFF models.