Issue |
J. Phys. IV France
Volume 04, Number C7, Juillet 1994
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique |
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Page(s) | C7-83 - C7-86 | |
DOI | https://doi.org/10.1051/jp4:1994721 |
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-83-C7-86
DOI: 10.1051/jp4:1994721
1 Dipartimento di Energetica, Università di Roma "La Sapienza", Via Scarpa 16, 00161 Roma, Italy
2 C.N.R. IRTEC-Faenza, Italy
© EDP Sciences 1994
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-83-C7-86
DOI: 10.1051/jp4:1994721
Numerical analysis of nonhomogeneous media through photothermal deflection method
M. Bertolotti1, M. Firpo1, A. Fontana1, G. Liakhou1, R. Li Voti1, C. Sibilia1 and G. De Portu21 Dipartimento di Energetica, Università di Roma "La Sapienza", Via Scarpa 16, 00161 Roma, Italy
2 C.N.R. IRTEC-Faenza, Italy
Abstract
A numerical analysis founded on the analog circuit model is applied to describe (surface or volume) defects and nonhomogeneities in materials, which can be detected through the Photothermal Deflection Method. Experimental results are also discussed.
© EDP Sciences 1994