| Issue |
J. Phys. IV France
Volume 04, Number C7, Juillet 1994
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique |
|
|---|---|---|
| Page(s) | C7-635 - C7-638 | |
| DOI | https://doi.org/10.1051/jp4:19947150 | |
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-635-C7-638
DOI: 10.1051/jp4:19947150
Laboratoire d'Optique Physique, UPR A0005 du CNRS, ESPCI, 10 rue Vauquelin, 75005 Paris, France
© EDP Sciences 1994
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-635-C7-638
DOI: 10.1051/jp4:19947150
Analysis of bulk sample photothermal response by time resolved ellipsometry
H. El Rhaleb and J.P. RogerLaboratoire d'Optique Physique, UPR A0005 du CNRS, ESPCI, 10 rue Vauquelin, 75005 Paris, France
Abstract
Ellipsometry is an optical technique where the polarisation of light beam reflected by a sample is analysed in order to determine its optical properties. Combining ellipsometry measurements with a pulsed excitation, we have been able to monitor in time the variation of the complex refractive index n - ik of a strongly absorbing bulk sample and to reach the absolute surface temperature history subsequent to the excitation in sub-microsecond time-scale.
© EDP Sciences 1994