| Issue |
J. Phys. IV France
Volume 03, Number C7, Novembre 1993
The 3rd European Conference on Advanced Materials and ProcessesTroisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés |
|
|---|---|---|
| Page(s) | C7-2063 - C7-2072 | |
| DOI | https://doi.org/10.1051/jp4:19937330 | |
The 3rd European Conference on Advanced Materials and Processes
Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés
J. Phys. IV France 03 (1993) C7-2063-C7-2072
DOI: 10.1051/jp4:19937330
1 Department of Physics, University of Bologna, via Irnerio 46, 40126 Bologna, Italy
2 Department of Materials Science, University of Lecce, via Arnesano, 73100 Lecce, Italy
3 Advanced Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-03, Japan
© EDP Sciences 1993
Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés
J. Phys. IV France 03 (1993) C7-2063-C7-2072
DOI: 10.1051/jp4:19937330
Holography and transmission electron microscopy
G. MATTEUCCI1, G. POZZI2 and A. TONOMURA31 Department of Physics, University of Bologna, via Irnerio 46, 40126 Bologna, Italy
2 Department of Materials Science, University of Lecce, via Arnesano, 73100 Lecce, Italy
3 Advanced Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-03, Japan
Abstract
The basic principles and methods of off-axis electron holography are presented and illustrated by means of three examples related to its application in high resolution electron microscopy and the investigation of electric and magnetic fields in thin specimens.
© EDP Sciences 1993