International Workshop on Electronic Crystals
S. Brazovskii, P. Monceau and N. Kirova
J. Phys. IV France 131 (2005) 143-146
DOI: 10.1051/jp4:2005131034

A single charge density wave dislocation observed by coherent X-ray diffraction

D. le Bolloc'h¹, S. Ravy², J. Dumas³, J. Marcus³, F. Livet⁴, C. Detlefs⁵, F. Yakhou⁵ and L. Paolasini<sup>5

1</sup>  Laboratoire de Physique des Solides (CNRS UMR 8502), Bât. 510, Université Paris sud, 91405 Orsay Cedex, France
²  Synchrotron SOLEIL, L'Orme des Merisiers, Saint Aubin, BP. 48, 91192 Gif-sur-Yvette Cedex, France
³  Laboratoire d'Études des Propriétés Électroniques des Solides, CNRS, BP. 166, 38042 Grenoble Cedex 9, France
⁴  LTPCM, ENSEEG, BP. 75, 38402 Saint Martin d'Hères Cedex, France
⁵  ESRF, BP. 220, 38043 Grenoble Cedex, France

Abstract
Coherent X-ray diffraction experiments have been performed on high quality crystals of the charge density wave (CDW) system K_0.3MoO₃. Regular fringes have been observed which are consistent with the presence of a single CDW dislocation. This dislocation is a screw-like dislocation which runs along chains axis and with a Burgers vector parallel to the CDW modulation. This first measurement confirms the presence of CDW dislocation embedded in the bulk in CDW systems and could throw light on the role of such topological defects in conversion processes of normal electrons in condensed electrons.

© EDP Sciences 2005